E. E. Elsayed, Mohammed R. Hayal, Davron Aslonqulovich Juraev, and Jo‘shqin Shakirovich Abdullayev, “Modeling Advanced Electronic Device Characterization Using a Unified Physics-Informed Machine Learning Framework”, Journal of Applied Sciences and Modelling, vol. 1, no. 1, pp. 9–18, Dec. 2025, doi: 10.71426/jasm.v1.i1.pp9-18.