ELSAYED, Ebrahim E.; MOHAMMED R. HAYAL; DAVRON ASLONQULOVICH JURAEV; JO‘SHQIN SHAKIROVICH ABDULLAYEV. Modeling Advanced Electronic Device Characterization Using a Unified Physics-Informed Machine Learning Framework. Journal of Applied Sciences and Modelling, [S. l.], v. 1, n. 1, p. 9–18, 2025. DOI: 10.71426/jasm.v1.i1.pp9-18. Disponível em: https://journal.krrishpub.com/index.php/jasm/article/view/21. Acesso em: 4 apr. 2026.