Elsayed, Ebrahim E., Mohammed R. Hayal, Davron Aslonqulovich Juraev, and Jo‘shqin Shakirovich Abdullayev. “Modeling Advanced Electronic Device Characterization Using a Unified Physics-Informed Machine Learning Framework”. Journal of Applied Sciences and Modelling 1, no. 1 (December 31, 2025): 9–18. Accessed April 4, 2026. https://journal.krrishpub.com/index.php/jasm/article/view/21.